Chip Manufacturing

Multiple electronic chips

Chip Manufacturing

KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems help substrate and IC manufacturers manage yield throughout the wafer and chip fabrication processes - from research and development to ?nal volume production. Wafer manufacturers use KLA's specialized wafer inspection, metrology, review and data analytics systems to help ensure their substrates are meeting defectivity, geometry and wafer shape quality standards. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher and more stable semiconductor die yields, and to improve overall pro?tability in the IC manufacturing process.

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