Product image of the InSEM HT
Product image of the InSEM HT
Alternative InSEM HT product image


The InSEM ® HT (high temperature) measures hardness, modulus and stiffness at high temperature by independently heating both the tip and sample in a vacuum environment. The InSEM ® HT is compatible with scanning electron microscope (SEM) and focused ion beam (FIB) chambers, or standalone vacuum chambers. The accompanying InView software helps advanced researchers develop novel experiments. Scientific publications show that InSEM ® HT results match well to traditional large-scale high temperature test data. The combination of wide temperature range capability and low cost of ownership makes the InSEM ® HT a valuable tool in materials development research programs.

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