Product image of the NanoFlip
Product image of the NanoFlip
Product image of the NanoFlip
Product image of the NanoFlip


The NanoFlip nanoindenter measures hardness, modulus, yield strength, stiffness and other nanomechanical tests with high accuracy and precision under both vacuum and ambient conditions. In both scanning electron microscope (SEM) and focused ion beam (FIB) systems, the NanoFlip excels at tests, such as pillar compression, while synchronizing the SEM images with the mechanical test data. The NanoFlip performs fast measurements, which are key to testing heterogeneous materials in inert environments (e.g., glove boxes). The suite of options available, such as the InForce50 electromagnetic actuator, combine to deliver quantitative results that lead to valuable solutions in material research.

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